The MultiDyne OG-5410-2TSG 3G/HD/SD-SDI Dual Test Signal Generator with Moving Box Active Signal Indication and Bi-Level/Tri-Level Sync Out offers an easy to use, economical solution to providing comprehensive test signal packages to ensure validity of downstream baseband SDI systems. The OG-5410-2TSG is an unprecedented first in the high-density openGear® based card form factor. Two independent generator blocks can be set to offer dual test packages which can be simultaneoulsy outputted or selectively fed to a single downstream path via a 2x4 output crosspoint.